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[´ã´ç¾÷¹«] - IGBT Cell & Ring Design - Test pattern ¼³°è ¹× Layout- Trench Gate & Back-side Process set-up - Full Process Integration - Static & Dynamic Test ¹× Characterization [±Ù¹«ºÎ¼ ¹× Á÷±Þ/Á÷Ã¥] Á÷±Þ/Á÷Ã¥: ÆÀ¿ø [±Ù¹«Áö] °æ±âµµ ºÎõ
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