Preparation of samples using SEM/TEM/FIB method
•Generate best-in-class data through quality control and continuous improvement
•Proper handling of sensitive customer samples and intellectual property
•Assisting customers in locating regions of interest, interpreting data, and troubleshooting when data does not meet expectations.
•Communicate with team members to facilitate technique transfers, pass down sample learnings, and advance the state of the art in semiconductor microscopy
•Maintain integrity of experiments and data in order to provide valid results.
•Requires sufficient technical familiarity with analysis tools and techniques to manage vendors and interact efficiently with vendor field service engineers when need arises to help deliver maximum asset availability
•Tool sets include: FIB(Focused Ion-Beam) assisted TEM sample-preparation techniques, Scanning Electron Microscope (SEM). Other metrology instruments helpful, such as TEM(Transmission Electron Microscope)
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