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SiC/GaN FA(°æ·Â)
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[´ã´ç¾÷¹«] - Wide band gap power device(GaN/SiC) ¼ÒÀç/ ±¸Á¶/¼ÒÀÚ Àü¹ÝÀûÀÎ failure analysis - Wafer/PKG Level¿¡¼ÀÇ ½Å·Ú¼º Æò°¡ fail Á¦Ç°¿¡ ´ëÇÑ Defect analysis, RCA(Root Cause Analysis)¸¦ ÅëÇØ °³¼±¹æÇâÀ» Á¦¾È/µµÃâ [±Ù¹«ºÎ¼ ¹× Á÷±Þ/Á÷Ã¥]
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[¿ì´ë»çÇ×] - WBG¼ÒÀÚ ½Å·Ú¼º ºÐ¼® ¹× lifetime ¿¹Ãø °æÇèÀÚ - WBG device Wafer/PKG Æò°¡ °æÇèÀÚ - SiC/GaN device ±¸Á¶ ¹× °øÁ¤ ÀÌÇØÀÚ
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