Application Engineer (3¸í) ä¿ë
¸ðÁýºÎ¹® ¹× ÀÚ°Ý¿ä°Ç
| ¸ðÁýºÎ¹® | ´ã´ç¾÷¹« | ÀÚ°Ý¿ä°Ç | Àοø |
|---|---|---|---|
Application Engineer (3¸í)ä¿ë/õ¾È±Ù¹« |
[´ã´ç¾÷¹«] ¼öÇà¾÷¹« [±Ù¹«ºÎ¼ ¹× Á÷±Þ/Á÷Ã¥]
|
[ÀÚ°Ý ¿ä°Ç] ¡á Memory Test À¯°æÇèÀÚ(Wafer Memory Test preference) • Wafer Test or Final Test Process ÀÌÇØ • ATE µ¿ÀÛ¿ø¸® ÀÌÇØ (Tester & Prober) ¡á Probe card °ü·Ã ¾÷¹« À¯°æÇèÀÚ(Application, Customer Service, Sales or Design) • Probe cardÀÇ ±¸Á¶, Á¾·ù ÀÌÇØ • Probe cardÀÇ Àü±âÀû Ư¼º ÀÌÇØ (Impedance, Crosstalk, Transmission line) ¡á Áß±¹¾î È¸È °¡´ÉÀÚ (Technical communication with customer) ¡á MS office »ç¿ë °¡´ÉÀÚ (Excel, Power Point µî) [¿ì´ë »çÇ×] ¡á OA(¿öµå ÇÁ·Î¼¼¼, ½ºÇÁ·¹µå ½ÃÆ®, ÇÁ¸®Á¨Å×ÀÌ¼Ç µî) °ü·Ã ÇÁ·Î±×·¥ »ç¿ë ´É·Â º¸À¯ÀÚ ¡á ÆÀ üÁ¦¿¡¼ÀÇ Ä¿¹Â´ÏÄÉÀÌ¼Ç ½ºÅ³ ´É·ÂÀ» º¸À¯ÇÑ ÀÚ ¡á Á¤È®ÇÏ°Ô ÀÏ Ã³¸®¸¦ ÇÒ ¼ö ÀÖ´Â ²Ä²ÄÇÑ ¼ºÇâÀ» °®Ãá ÀÚ |
3 ¸í |
±Ù¹«Á¶°Ç
ÀüÇü´Ü°è ¹× Á¦Ãâ¼·ù
Á¢¼ö¹æ¹ý
ä¿ë½Ã
±âŸ À¯ÀÇ»çÇ×
00