Å×½ºÆ® ±â¼ú(Test Engineering) Àü¹®°¡ ä¿ë (1¸í, Ã¥ÀÓ~¼ö¼®±Þ)

 

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- Test Engineering (LCD Driver IC)

 

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- Tester Platform °ËÅä ¹× ¼±Á¤

- Probe Card / QCOF Card / Final Test Card »ç¾ç °ËÅä ¹× °³¹ß

- Test Plan ¼ö¸³ ¹× Vector Review

- EDS / Final Test / QCOF Test Program °³¹ß ¹× Coding - Test ¾Ë°í¸®Áò °³¹ß ¹× Æò°¡ ¹æ¹ý ¼³°è

- Wafer Full Characterization ¼öÇà - AC / DC / Temperature Characterization

- Á¦Ç° Æò°¡ ¹× °í°´ Sample ÃâÇÏ Áö¿ø

- Test Time ÃÖÀûÈ­ ¹× »ý»ê¼º °³¼±

- Corner Lot Evaluation ¼öÇà

- Multi-Parameter Test Program °³¹ß

- Test Program Conversion - (ND3 ¡ê ND4, NDx ¡ê YKGW µî)

- ESD / ½Å·Ú¼º / ºÒ·® ºÐ¼® Áö¿ø

 

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- °æ·Â 10³â ÀÌ»ó (Ã¥ÀÓ~¼ö¼®±Þ)

- LCD Driver IC Test °³¹ß °æÇè Çʼö

- Advantest / YKGW Tester ¿î¿ë ¹× °³¹ß °æÇè º¸À¯ÀÚ

- EDS / Wafer Test / Final Test Àü¹Ý¿¡ ´ëÇÑ ÀÌÇØ ¹× ½Ç¹« °æÇè

- Test Program °³¹ß ¹× Debug °æÇè

 

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- Test Time °³¼± ¹× Yield Çâ»ó °æÇè º¸À¯ÀÚ

- ¹ÝµµÃ¼ ¾ç»ê ´ëÀÀ ¹× °í°´ ´ëÀÀ °æÇè

- ºÒ·® ºÐ¼® ¹× ½Å·Ú¼º Æò°¡ °æÇè

- ´Ù¾çÇÑ Tester Platform °£ Program Conversion °æÇè

- Display Driver IC Á¦Ç° °³¹ß Àü Áֱ⠰æÇèÀÚ

 

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