Å×½ºÆ® ±â¼ú(Test
Engineering) Àü¹®°¡ ä¿ë (1¸í, Ã¥ÀÓ~¼ö¼®±Þ)
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- Test
Engineering (LCD Driver IC)
[´ã´ç¾÷¹«]
-
Tester Platform °ËÅä ¹× ¼±Á¤
-
Probe Card / QCOF Card / Final Test Card »ç¾ç °ËÅä ¹× °³¹ß
- Test
Plan ¼ö¸³ ¹×
Vector Review
- EDS
/ Final Test / QCOF Test Program °³¹ß
¹× Coding - Test ¾Ë°í¸®Áò °³¹ß ¹× Æò°¡ ¹æ¹ý ¼³°è
-
Wafer Full Characterization ¼öÇà - AC / DC / Temperature Characterization
- Á¦Ç° Æò°¡ ¹× °í°´ Sample ÃâÇÏ Áö¿ø
- Test
Time ÃÖÀûÈ ¹× »ý»ê¼º °³¼±
-
Corner Lot Evaluation ¼öÇà
-
Multi-Parameter Test Program °³¹ß
- Test
Program Conversion - (ND3 ¡ê ND4, NDx ¡ê YKGW µî)
- ESD
/ ½Å·Ú¼º / ºÒ·®
ºÐ¼® Áö¿ø
[ÀÚ°Ý¿ä°Ç]
- °æ·Â 10³â ÀÌ»ó (Ã¥ÀÓ~¼ö¼®±Þ)
- LCD
Driver IC Test °³¹ß °æÇè Çʼö
-
Advantest / YKGW Tester ¿î¿ë ¹× °³¹ß °æÇè
º¸À¯ÀÚ
- EDS
/ Wafer Test / Final Test Àü¹Ý¿¡ ´ëÇÑ
ÀÌÇØ ¹× ½Ç¹« °æÇè
- Test
Program °³¹ß ¹×
Debug °æÇè
[¿ì´ë»çÇ×]
- Test
Time °³¼± ¹× Yield
Çâ»ó °æÇè º¸À¯ÀÚ
- ¹ÝµµÃ¼ ¾ç»ê ´ëÀÀ ¹× °í°´ ´ëÀÀ °æÇè
- ºÒ·® ºÐ¼® ¹× ½Å·Ú¼º Æò°¡ °æÇè
- ´Ù¾çÇÑ Tester Platform °£ Program Conversion °æÇè
-
Display Driver IC Á¦Ç° °³¹ß Àü Áֱ⠰æÇèÀÚ
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