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- Test Engineering (LCD Driver IC)
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- Tester Platform °ËÅä ¹× ¼±Á¤
- Probe Card / QCOF Card / Final Test Card »ç¾ç °ËÅä ¹× °³¹ß
- Test Plan ¼ö¸³ ¹× Vector Review
- EDS / Final Test / QCOF Test Program °³¹ß ¹× Coding - Test ¾Ë°í¸®Áò °³¹ß ¹× Æò°¡ ¹æ¹ý ¼³°è
- Wafer Full Characterization ¼öÇà - AC / DC / Temperature Characterization
- Á¦Ç° Æò°¡ ¹× °í°´ Sample ÃâÇÏ Áö¿ø
- Test Time ÃÖÀûÈ ¹× »ý»ê¼º °³¼±
- Corner Lot Evaluation ¼öÇà
- Multi-Parameter Test Program °³¹ß
- Test Program Conversion - (ND3 ¡ê ND4, NDx ¡ê YKGW µî)
- ESD / ½Å·Ú¼º / ºÒ·® ºÐ¼® Áö¿ø
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- LCD Driver IC Test °³¹ß °æÇè Çʼö
- Advantest / YKGW Tester ¿î¿ë ¹× °³¹ß °æÇè º¸À¯ÀÚ
- EDS / Wafer Test / Final Test Àü¹Ý¿¡ ´ëÇÑ ÀÌÇØ ¹× ½Ç¹« °æÇè
- Test Program °³¹ß ¹× Debug °æÇè
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- Test Time °³¼± ¹× Yield Çâ»ó °æÇè º¸À¯ÀÚ
- ¹ÝµµÃ¼ ¾ç»ê ´ëÀÀ ¹× °í°´ ´ëÀÀ °æÇè
- ºÒ·® ºÐ¼® ¹× ½Å·Ú¼º Æò°¡ °æÇè
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